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Applying technology developed and patented by Jim Koch and the University of Connecticut, Ionyx is developing a system that brings cutting edge surface science technology to forensics and biometrics.
FET utilizes an ion beam to mix fingerprint residue with substrate material at the atomic level. The result is discovery of fingerprint evidence that was previously undetectable, and greater clarity for all prints. The evidence is preserved in such a way that it can handle repeated imaging and analysis using surface science techniques (such as Secondary Ion Mass Spectrometry, or SIMS) previously unavailable to the forensic community.
The resolution of such a system provides detection levels of better than one part per million, a factor of 100 increase over current technologies. Macro features such as sweat pores and incipient ridges can be studied and compared with more accuracy, and chemical analysis can be performed, detecting trace chemicals and providing detailed history never before available. The applications for latent fingerprint identification extend from cold-case files, to evidence confirmation and beyond.
FET does not replace current latent fingerprint detection methods such as chemical fuming and ninhydrin; it supplements these methods. FET also has the potential to provide fingerprint evidence on samples where organic compounds levels are insufficient for DNA analysis.
While a commercially available FET system is still a few years away, we are currently working with leaders in the field of surface science and forensics in developing a world-class system. Meanwhile, we are active in providing customers with current surface science technology (such as Static SIMS), previously unavailable to forensics and biometrics laboratories.
ionyx is a division of
For over a decade RBD has been provided products, engineering, and service to leaders in the surface science and analysis industry, such as the University of Connecticut.
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